Development of tensile testing machine for x-ray microtomography

Masahiro Yoshinaga, Yukihiro Nishikawa, Hiroyuki Komori, Ichiro Koga, Masashi Inoue, Toshio Nishi, Hiroshi Jinnai

研究成果: Paper査読

抄録

X-ray microtomography (XμCT) is a powerful tool to observe the interior three-dimensional (3D) structures of the sample without destruction. By using the nano-focus X-ray source and high-resolution X-ray detectors, the spatial resolution of XμCT is approaching 1 μm. XμCT is applicable to the opaque samples, which is one of the advantages to the laser-scanning confocal microscopy. In the present study, a tensile testing machine was developed as an attachment to XμCT. The components of the tensile testing machine are enclosed in a monolithic beryllium tube, the diameter is 17 mm and the thickness is 1 mm. The maximum load is 100 N, and the range of the cross-head speed is 0.1 - 10 mm/min. The maximum stroke is 20 mm. The maximum thickness and width of the specimen are, respectively, 0.5 mm and 5.0 mm. The length of the sample is 15 mm to 25 mm.

本文言語English
ページ数1
出版ステータスPublished - 2006 10月 18
外部発表はい
イベント55th SPSJ Annual Meeting - Nagoya, Japan
継続期間: 2006 5月 242006 5月 26

Other

Other55th SPSJ Annual Meeting
国/地域Japan
CityNagoya
Period06/5/2406/5/26

ASJC Scopus subject areas

  • 工学(全般)

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