Development of an apparatus for in-situ near-field photoexcitation in a transmission electron microscope

研究成果: Article査読

5 被引用数 (Scopus)

抄録

An area observed with a transmission electron microscope (TEM) was illuminated with a far-field light probe (with a diameter of 10 μm) under the TEM observation. A tungsten tip covered with a silver layer (with a diameter of 60nm at the tip apex) was placed close to the observed area, and an intense near-field light was induced in the immediate vicinity of the tip apex due to a tip-enhanced effect. By using the near-field light probe with a high spatial resolution beyond the diffraction limit of light, photo-induced glide of an individual dislocation was demonstrated in ZnO.

本文言語English
論文番号125204
ジャーナルApplied Physics Express
5
12
DOI
出版ステータスPublished - 2012 12 1

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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