Development of a spot reliability evaluation score for DNA microarrays

Yonehiro Matsumura, Kazuro Shimokawa, Yoshihide Hayashizaki, Kazuho Ikeo, Yoshio Tateno, Jun Kawai

研究成果: Article査読

1 被引用数 (Scopus)

抄録

We developed a reliability index named SRED (Spot Reliability Evaluation Score for DNA microarrays) that represents the probability that the calibrated gene expression level from a DNA microarray would be less than a factor of 2 different from that of quantitative real-time polymerase chain reaction assays whose dynamic quantification range is treated statistically to be similar to that of the DNA microarray. To define the SRED score, two parameters, the reproducibility of measurement value and the relative expression value were selected from nine candidate parameters. The SRED score supplies the probability that the expression level in each spot of a microarray is less than a certain-fold different compared to other expression profiling data, such as QRT-PCR. This score was applied to ∼1,500,000 points of the expression profile in the RIKEN Expression Array Database.

本文言語English
ページ(範囲)149-160
ページ数12
ジャーナルGene
350
2
DOI
出版ステータスPublished - 2005 5 9
外部発表はい

ASJC Scopus subject areas

  • 遺伝学

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