Development of a novel straining holder for transmission electron microscopy compatible with single tilt-axis electron tomography

K. Sato, H. Miyazaki, T. Gondo, S. Miyazaki, M. Murayama, S. Hata

    研究成果: Article査読

    12 被引用数 (Scopus)

    抄録

    We have developed a newly designed straining specimen holder for in situ transmission electron microscopy (TEM) compatible with high-angle single tilt-axis electron tomography. The holder can deform a TEM specimen under tensile stress with the strain rate between 1.5 × 10−6 and 5.2 × 10−3 s−1. We have also confirmed that the maximum tilt angle of the specimen holder reaches ±60° with a rectangular shape aluminum specimen. The new specimen holder, termed as ‘straining and tomography holder’, will have wide range potential applications in materials science.

    本文言語English
    ページ(範囲)369-375
    ページ数7
    ジャーナルMicroscopy
    64
    5
    DOI
    出版ステータスPublished - 2015 10月

    ASJC Scopus subject areas

    • 構造生物学
    • 器械工学
    • 放射線学、核医学およびイメージング

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