Development of a novel combined scanning electrochemical microscope (SECM) and scanning ion-conductance microscope (SICM) probe for soft sample imaging

Andrew J. Pollard, Nilofar Faruqui, Michael Shaw, Charles A. Clifford, Yasufumi Takahashi, Yuri E. Korchev, Neil Ebejer, Julie V. Macpherson, Patrick R. Unwin, Debdulal Roy

    研究成果: Conference contribution

    1 被引用数 (Scopus)

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    Engineering & Materials Science

    Physics & Astronomy

    Chemical Compounds