Complex X-ray holography (CXH) using resonant scattering is proposed as a new atomic resolution holography method. CXH provides us a solution for the twin-image problem as well as elemental identification in real space. Accurate differences among intensities recorded at several X-ray energies around an absorption edge must be experimentally obtained in the CXH method. Taking into account that the holographic signal is of the order of 0.1% of its background, we find it difficult to carry out using ordinary technique for hologram measurement. Thus, in order to measure holograms with a very good S/N ratio, a sample was cooled about 100 K and fluorescent X-rays were focused on a detector with a cylindrical graphite analyzer in the X-ray fluorescence holography apparatus at SPring-8. Ga fluorescent holograms of GaAs were recorded at energies near the As K absorption edge. A change of holographic oscillations due to the resonant scattering, which is expected from the computer simulation, was firstly observed.
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