Development of a high-performance angle-resolving electron energy analyzer

S. Shiraki, H. Ishii, Y. Nihei

    研究成果: Conference article査読

    11 被引用数 (Scopus)

    抄録

    An angle-resolving electron energy analyzer has been developed with a newly designed input-lens system. In this lens system, angle-resolving is accomplished by use of the diffraction plane aperture. Using this system, both high angular resolution and high transmission are easily performed in photoelectron diffraction (PED) measurements. In addition, the angular resolution is easily determined by the size of the diffraction plane aperture. In order to evaluate this analyzer, we measured the X-ray photoelectron diffraction (XPED) patterns from MgO(001) and CaF2(111) surfaces.

    本文言語English
    ページ(範囲)1043-1048
    ページ数6
    ジャーナルJournal of Electron Spectroscopy and Related Phenomena
    114-116
    DOI
    出版ステータスPublished - 2001 3
    イベント8th International Conference on Electronic Spectroscopy and Structure (ICESS-8) - Berkeley, CA, USA
    継続期間: 2000 8 82000 8 12

    ASJC Scopus subject areas

    • 電子材料、光学材料、および磁性材料
    • 放射線
    • 原子分子物理学および光学
    • 凝縮系物理学
    • 分光学
    • 物理化学および理論化学

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