Development and trial measurements of hard X-ray photoelectron emission microscope

T. Taniuchi, T. Wakita, M. Takagaki, N. Kawamura, M. Suzuki, T. Nakamura, K. Kobayashi, M. Kotsugi, M. Oshima, H. Akinaga, H. Muraoka, K. Ono

研究成果: Conference contribution

2 被引用数 (Scopus)

抄録

Photoelectron emission microscope (PEEM) study is performed using hard x-ray illumination. We have successfully obtained images with high spatial resolution of 40 nm with hard x-rays. Spectro-microscopy of Co micro-patterns on Si substrates, which can be applied to XAFS measurements on a minute scale by PEEM. Magnetic imaging has been demonstrated at the Pt L-edges on perpendicular magnetic recording pattern of CoCrPt alloy. These results are the first step toward a new spectroscopic microscopy and magnetic imaging in a hard x-ray region.

本文言語English
ホスト出版物のタイトルSYNCHROTRON RADIATION INSTRUMENTATION
ホスト出版物のサブタイトルNinth International Conference on Synchrotron Radiation Instrumentation
ページ1353-1356
ページ数4
DOI
出版ステータスPublished - 2007
外部発表はい
イベントSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation - Daegu, Korea, Republic of
継続期間: 2006 5 282006 6 28

出版物シリーズ

名前AIP Conference Proceedings
879
ISSN(印刷版)0094-243X
ISSN(電子版)1551-7616

Other

OtherSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
国/地域Korea, Republic of
CityDaegu
Period06/5/2806/6/28

ASJC Scopus subject areas

  • 物理学および天文学(全般)

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