Developing a method for urban damage mapping using radar signatures of building footprint in SAR imagery: A case study after the 2013 Super Typhoon Haiyan

Bruno Adriano, Erick Arturo Mas Samanez, Shunichi Koshimura, Hideomi Gokon, Wen Liu, Masashi Matsuoka

研究成果: Conference contribution

3 引用 (Scopus)

抜粋

In this study, a practical methodology was presented to map damaged buildings using high resolution synthetic aperture radar (SAR) images and post-event building damage data from the 2013 Super Typhoon Haiyan, in Tacloban city, the Philippines. To detect destroyed structures, we focused on the changes in the radar signal within footprints of buildings between pre- and post-event SAR images. The method was tested using a 1.0 m resolution COSMO-SkyMed SAR images taken over Tacloban city, the Philippines. The method proves, with 73% accuracy in this case, to be suitable for estimating destroyed buildings.

元の言語English
ホスト出版物のタイトル2015 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2015 - Proceedings
出版者Institute of Electrical and Electronics Engineers Inc.
ページ3579-3582
ページ数4
ISBN(電子版)9781479979295
DOI
出版物ステータスPublished - 2015 11 10
イベントIEEE International Geoscience and Remote Sensing Symposium, IGARSS 2015 - Milan, Italy
継続期間: 2015 7 262015 7 31

出版物シリーズ

名前International Geoscience and Remote Sensing Symposium (IGARSS)
2015-November

Other

OtherIEEE International Geoscience and Remote Sensing Symposium, IGARSS 2015
Italy
Milan
期間15/7/2615/7/31

ASJC Scopus subject areas

  • Computer Science Applications
  • Earth and Planetary Sciences(all)

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    Adriano, B., Mas Samanez, E. A., Koshimura, S., Gokon, H., Liu, W., & Matsuoka, M. (2015). Developing a method for urban damage mapping using radar signatures of building footprint in SAR imagery: A case study after the 2013 Super Typhoon Haiyan. : 2015 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2015 - Proceedings (pp. 3579-3582). [7326595] (International Geoscience and Remote Sensing Symposium (IGARSS); 巻数 2015-November). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IGARSS.2015.7326595