Determination of the spatial resolution of an aperture-type near-field scanning optical microscope using a standard sample of a quantum-dot-embedded polymer film

Jeongyong Kim, D. C. Kim, K. Nakajima, T. Mitsui, H. Aoki

    研究成果: Article査読

    3 被引用数 (Scopus)

    抄録

    The near-field scanning optical microscope (NSOM) is a form of scanning probe microscope that achieves, through the use of the near-field, a spatial resolution significantly superior to that defined by the Abbe diffraction limit. Although the term spatial resolution has a clear meaning, it is often used in different ways in characterizing the NSOM instrument. In this paper, we describe the concept, the cautions, and the general guidelines of a method to measure the spatial resolution of an aperture-type NSOM instrument. As an example, a quantum dot embedded polymer film was prepared and imaged as a test sample, and the determination of the lateral resolution was demonstrated using the described method.

    本文言語English
    ページ(範囲)1748-1753
    ページ数6
    ジャーナルJournal of the Korean Physical Society
    56
    6
    DOI
    出版ステータスPublished - 2010 6 15

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

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