Detection method for overclocking by intentional electromagnetic interference

Atsushi Nagao, Yuichiro Okugawa, Kazhiro Takaya, Yu-Ichi Hayashi, Naofumi Homma, Takafumi Aoki

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

Overclocking due to the disruption of a clock signal sometimes causes malfunctions (i.e., temporal faults) in LSI modules. It is known that electromagnetic interference can also cause overclocking. However, there is no specific method for detecting the occurrence of such overclocking in LSI modules. This paper proposes a method for detecting overclocking in LSI modules and its implementation as a detection circuit. We evaluate the validity of the proposed circuit through two kind of experiments (i) with a clock signal with artificially-inserted glitches and (ii) with CWs injected externally. From the 1st experiment, we confirm that our detection circuit can correctly determine whether overclocking (i.e., glitchy clock signal) is generated or not. From the 2nd experiment, we observe that the output sequence of our detection circuit indicates the occurrence of overclocking by injected CWs. At the same time, we also show the corresponding fluctuation in the voltage of clock signal due to the overlapped CW.

本文言語English
ホスト出版物のタイトル2015 IEEE International Symposium on Electromagnetic Compatibility, EMC 2015
出版社Institute of Electrical and Electronics Engineers Inc.
ページ241-245
ページ数5
ISBN(電子版)9781479966158
DOI
出版ステータスPublished - 2015 9 10
イベントIEEE International Symposium on Electromagnetic Compatibility, EMC 2015 - Dresden, Germany
継続期間: 2015 8 162015 8 22

出版物シリーズ

名前IEEE International Symposium on Electromagnetic Compatibility
2015-Septmber
ISSN(印刷版)1077-4076
ISSN(電子版)2158-1118

Other

OtherIEEE International Symposium on Electromagnetic Compatibility, EMC 2015
国/地域Germany
CityDresden
Period15/8/1615/8/22

ASJC Scopus subject areas

  • 凝縮系物理学
  • 電子工学および電気工学

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