抄録
A CMOS cascode amplifier, biased near the threshold voltage of a MOSFET, for terahertz direct detection is proposed. A CMOS terahertz imaging circuit (size: 250 × 180 ìm) is designed and fabricated on the basis of low-cost 180-nm CMOS process technology. The imaging circuit consists of a microstrip patch antenna, an impedance-matching circuit, and a direct detector. It achieves a responsivity of 51.9 kV/W at 0.915 THz and a noise equivalent power (NEP) of 358 pW/Hz1/2 at a modulation frequency of 31 Hz. NEP is estimated to be reduced to 42 pW/Hz1/2 at 100 kHz. These results suggest that cost-efficient terahertz imaging is possible in the near future.
本文言語 | English |
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論文番号 | 1640014 |
ジャーナル | International Journal of High Speed Electronics and Systems |
巻 | 25 |
号 | 3-4 |
DOI | |
出版ステータス | Published - 2016 9月 1 |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料
- ハードウェアとアーキテクチャ
- 電子工学および電気工学