Dependence of thin film media microstructure and recording properties on composition of Cr-based very thin seedlayer

Satoru Yoshimura; D. D. Djayaprawira; Masaki Mikami; Migaku Takahashi; Kazuya Komiyama

Dependence of thin film media microstructure and recording properties on composition of Cr-based very thin seedlayer

Satoru Yoshimura, D. D. Djayaprawira, Masaki Mikami, Migaku Takahashi, Kazuya Komiyama

研究成果: Conference article › 査読

抄録

The dependence of microstructure, magnetic and R/W properties on the melting point of very thin Cr-based seedlayers were discussed. The melting point of the seedlayer was varied from 1600 °C to 3400 °C. Results showed that WCr seedlayer with the thickness of about 1 nm is effective to reduce both the grain size and the media noise in longitudinal media.

本文言語	English
ジャーナル	Digests of the Intermag Conference
出版ステータス	Published - 2002 12月 1
イベント	2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands 継続期間: 2002 4月 28 → 2002 5月 2

ASJC Scopus subject areas

電子工学および電気工学

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引用スタイル

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title = "Dependence of thin film media microstructure and recording properties on composition of Cr-based very thin seedlayer",

abstract = "The dependence of microstructure, magnetic and R/W properties on the melting point of very thin Cr-based seedlayers were discussed. The melting point of the seedlayer was varied from 1600 °C to 3400 °C. Results showed that WCr seedlayer with the thickness of about 1 nm is effective to reduce both the grain size and the media noise in longitudinal media.",

author = "Satoru Yoshimura and Djayaprawira, {D. D.} and Masaki Mikami and Migaku Takahashi and Kazuya Komiyama",

year = "2002",

month = dec,

day = "1",

language = "English",

journal = "Digests of the Intermag Conference",

issn = "0074-6843",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG ; Conference date: 28-04-2002 Through 02-05-2002",

}

TY - JOUR

T1 - Dependence of thin film media microstructure and recording properties on composition of Cr-based very thin seedlayer

AU - Yoshimura, Satoru

AU - Djayaprawira, D. D.

AU - Mikami, Masaki

AU - Takahashi, Migaku

AU - Komiyama, Kazuya

PY - 2002/12/1

Y1 - 2002/12/1

N2 - The dependence of microstructure, magnetic and R/W properties on the melting point of very thin Cr-based seedlayers were discussed. The melting point of the seedlayer was varied from 1600 °C to 3400 °C. Results showed that WCr seedlayer with the thickness of about 1 nm is effective to reduce both the grain size and the media noise in longitudinal media.

AB - The dependence of microstructure, magnetic and R/W properties on the melting point of very thin Cr-based seedlayers were discussed. The melting point of the seedlayer was varied from 1600 °C to 3400 °C. Results showed that WCr seedlayer with the thickness of about 1 nm is effective to reduce both the grain size and the media noise in longitudinal media.

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M3 - Conference article

AN - SCOPUS:0036913109

SN - 0074-6843

JO - Digests of the Intermag Conference

JF - Digests of the Intermag Conference

T2 - 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG

Y2 - 28 April 2002 through 2 May 2002

ER -

Dependence of thin film media microstructure and recording properties on composition of Cr-based very thin seedlayer

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