Dependence of thin film media microstructure and recording properties on composition of Cr-based very thin seedlayer

Satoru Yoshimura, D. D. Djayaprawira, Masaki Mikami, Migaku Takahashi, Kazuya Komiyama

    研究成果: Conference article査読

    抄録

    The dependence of microstructure, magnetic and R/W properties on the melting point of very thin Cr-based seedlayers were discussed. The melting point of the seedlayer was varied from 1600 °C to 3400 °C. Results showed that WCr seedlayer with the thickness of about 1 nm is effective to reduce both the grain size and the media noise in longitudinal media.

    本文言語English
    ジャーナルDigests of the Intermag Conference
    出版ステータスPublished - 2002 12 1
    イベント2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
    継続期間: 2002 4 282002 5 2

    ASJC Scopus subject areas

    • 電子工学および電気工学

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