The dependence of microstructure, magnetic and R/W properties on the melting point of very thin Cr-based seedlayers were discussed. The melting point of the seedlayer was varied from 1600 °C to 3400 °C. Results showed that WCr seedlayer with the thickness of about 1 nm is effective to reduce both the grain size and the media noise in longitudinal media.
|ジャーナル||Digests of the Intermag Conference|
|出版ステータス||Published - 2002 12月 1|
|イベント||2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands|
継続期間: 2002 4月 28 → 2002 5月 2
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