Demonstration of stimulated emission depletion phenomenon in luminescence of solid-state scintillator excited by soft X-rays

Takeo Ejima, Toshitaka Wakayama, Natsumi Shinozaki, Misaki Shoji, Genta Hatayama, Takeshi Higashiguchi

    研究成果: Article査読

    2 被引用数 (Scopus)

    抄録

    Although imaging techniques using soft X-rays (SXs) are being developed as the available photon flux increases because of the continuing development of synchrotron light sources, it will be necessary to downsize the pixel size of the SX camera to produce finer SX images. Application of the stimulated emission depletion (STED) method to a scintillator plate followed by use of this plate as a sensor is one promising method to reduce the pixel size of SX cameras. A STED phenomenon occurred in the luminescence of a Ce-doped Lu2SiO5 crystal (Ce:LSO) excited using ultraviolet (UV) light when the scintillator was irradiated with azimuthally polarized laser light in the photon energy range from 1.97 eV (630 nm) to 2.58 eV (480 nm). When the excitation light source changed to synchrotron radiation (SR) light with photon energy of 800 eV, the same STED phenomenon occurred. The spot size of the luminescence was reduced by the STED phenomenon and this spot size decreased as the STED laser’s photon energy increased. The energy dependence of the Ce:LSO luminescence levels can be used to explain the change in the spot size at the luminescence point.

    本文言語English
    論文番号5391
    ジャーナルScientific reports
    10
    1
    DOI
    出版ステータスPublished - 2020 12 1

    ASJC Scopus subject areas

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