Degradation of potential barriers in ZnO-based chip varistors due to electrostatic discharge

Sakyo Hirose, Hideaki Niimi, Keisuke Kageyama, Hideharu Ieki, Takahisa Omata, Shinya Otsuka-Yao-Matsuo

研究成果: Article査読

10 被引用数 (Scopus)

抄録

Degradation of potential barriers in ZnO-based varistors due to the electrostatic discharge (ESD) was investigated using scanning probe microanalysis and capacitance-time and isothermal capacitance transient spectroscopies. Pr 6O 11-ZnO (Pr-ZnO) varistors exhibit excellent ESD withstand capability compared with Bi 2O 3-ZnO (Bi-ZnO) varistors. After the application of ESD, asymmetrically degraded double Schottky barriers were observed in both Pr-ZnO and Bi-ZnO varistors, and the Schottky barrier in Bi-ZnO was found to be destroyed. The potential barriers of both types of varistors can respond to an ESD pulse, whose rise time is ∼1 ns, but after application of the ESD pulse, the Bi-ZnO varistor takes more time to recover its initial capacitance than does the Pr-ZnO varistor. Such difference in the transient behaviors of potential barriers is attributed to differences in the energy and distribution of interfacial states of Pr-ZnO and Bi-ZnO varistors. Experimental results clearly indicated a strong correlation between the transient behaviors of potential barriers and the ESD withstand capabilities of ZnO-based varistors.

本文言語English
論文番号033707
ジャーナルJournal of Applied Physics
112
3
DOI
出版ステータスPublished - 2012 8月
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(全般)

フィンガープリント

「Degradation of potential barriers in ZnO-based chip varistors due to electrostatic discharge」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル