Current-voltage characteristics and layer coupling in amorphous W/Si multilayers

Y. Matsuo, T. Nojima, Y. Kuwasawa, E. Majková, S. Luby

研究成果: Article査読

6 被引用数 (Scopus)

抄録

Current-voltage (I-V) characteristics have been measured on the amorphous W monolayers and W/Si multilayers in the absence of magnetic field. For the monolayers and the multilayers with thick Si layers, the I-V curves show straight lines on a log-log scale and the Kosterlitz-Thouless transition. On the other hand, for the multilayers with thin Si layers, they show negative curvatures on such a scale at low temperatures. This is attributed to the effect of interlayer coupling giving rise to the dimensional crossover of vortex configuration. Our results are discussed with the theories which take the coupling effect into consideration.

本文言語English
ページ(範囲)138-144
ページ数7
ジャーナルPhysica C: Superconductivity and its applications
277
1-2
DOI
出版ステータスPublished - 1997 4 1
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • エネルギー工学および電力技術
  • 電子工学および電気工学

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