We investigate the relationship between the magnetoresistance and the interfacial roughness of Co/Cu superlattices whose interface structures are varied by changing sputtering methods, varying sputtering gas pressure and annealing temperatures. X-ray diffraction (XRD) experiments have revealed that the root mean square roughness determined from low-angle XRD spectra is a good measure to evaluate the interfacial roughness which determines the areal occupation of antiferromagnetically coupled regions and the magnetoresistance ratio.
|ジャーナル||Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers|
|出版ステータス||Published - 1994 11月|
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