Correlation of giant magnetoresistance with interfacial roughness in Co/Cu superlattices

Haruhisa Ueda, Osamu Kitakami, Yutaka Shimada, Yoshinori Goto, Masaki Yamamoto

研究成果: Article査読

26 被引用数 (Scopus)

抄録

We investigate the relationship between the magnetoresistance and the interfacial roughness of Co/Cu superlattices whose interface structures are varied by changing sputtering methods, varying sputtering gas pressure and annealing temperatures. X-ray diffraction (XRD) experiments have revealed that the root mean square roughness determined from low-angle XRD spectra is a good measure to evaluate the interfacial roughness which determines the areal occupation of antiferromagnetically coupled regions and the magnetoresistance ratio.

本文言語English
ページ(範囲)6173-6178
ページ数6
ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
33
11
出版ステータスPublished - 1994 11月
外部発表はい

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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