Confirmation of vacancy-type stacking fault tetrahedra in quenched, deformed and irradiated face-centred cubic metals

Satoshi Kojima, Yuhki Satoh, Hiroyuki Taoka, Iwao Ishida, Toshimasa Yoshiie, Michio Kiritani, Michio Kiritani

研究成果: Article査読

47 被引用数 (Scopus)

抄録

An efficient and reliable method for characterizing the nature of stacking fault tetrahedra in f.c.c. metals using electron microscope diffraction image contrasts is presented. By using the 220 reflection, and thereby eliminating the contrast from overlapping stacking faults, one can differentiate between intrinsic-type stacking fault tetrahedra due to lattice vacancies and extrinsic type due to interstitial atoms. The validity of the method is examined by the observation of vacancy-type stacking fault tetrahedra in quenched metals, and by the observation of interstitial-type faulted dislocation loops. Stacking fault tetrahedra introduced by plastic deformation, electron irradiation, neutron irradiation and ion irradiation are all confirmed to be vacancy type. It was found that interstitial-type stacking fault tetrahedra do not exist.

本文言語English
ページ(範囲)519-532
ページ数14
ジャーナルPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
59
3
DOI
出版ステータスPublished - 1989 3

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 材料科学(全般)
  • 凝縮系物理学
  • 物理学および天文学(その他)
  • 金属および合金

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