Coherent diffraction imaging analysis of shape-controlled nanoparticles with focused hard X-ray free-electron laser pulses

Yukio Takahashi, Akihiro Suzuki, Nobuyuki Zettsu, Tomotaka Oroguchi, Yuki Takayama, Yuki Sekiguchi, Amane Kobayashi, Masaki Yamamoto, Masayoshi Nakasako

研究成果: Article査読

49 被引用数 (Scopus)

抄録

We report the first demonstration of the coherent diffraction imaging analysis of nanoparticles using focused hard X-ray free-electron laser pulses, allowing us to analyze the size distribution of particles as well as the electron density projection of individual particles. We measured 1000 single-shot coherent X-ray diffraction patterns of shape-controlled Ag nanocubes and Au/Ag nanoboxes and estimated the edge length from the speckle size of the coherent diffraction patterns. We then reconstructed the two-dimensional electron density projection with sub-10 nm resolution from selected coherent diffraction patterns. This method enables the simultaneous analysis of the size distribution of synthesized nanoparticles and the structures of particles at nanoscale resolution to address correlations between individual structures of components and the statistical properties in heterogeneous systems such as nanoparticles and cells.

本文言語English
ページ(範囲)6028-6032
ページ数5
ジャーナルNano Letters
13
12
DOI
出版ステータスPublished - 2013 12月 11
外部発表はい

ASJC Scopus subject areas

  • バイオエンジニアリング
  • 化学 (全般)
  • 材料科学(全般)
  • 凝縮系物理学
  • 機械工学

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