Chemically-induced structural deformation of layered perovskite oxides

    研究成果: Conference contribution

    抜粋

    In order to understand the behavior of the crystal lattice deformation induced by the interstitial oxygen formation in La2(Ni0.9M0.1)O4+δ (M = Fe, Co, Cu), thermogravimetry, coulometric titration, and high temperature X-ray diffraction measurements were carried out in the temperature range between 873 to 1173 K and the P(O2) range between 10-24 to 1 bar. Oxygen content variation under wide range of P(O2) could be successfully evaluated by combining thermogravimetry and coulometric titration techniques. Compared with non-doped La2NiO4+δ, La2(Ni0.9Fe0.1)O4+δ and La2(Ni0.9Co0.1)O4+δ have more interstitial oxygen while La2(Ni0.9Cu0.1)O4+δ have less. Crystal structure at high temperatures was analyzed assuming the tetragonal symmetry, I4/mmm, for all compositions. With increasing interstitial oxygen concentration, the lattice parameter perpendicular to the perovskite layer increased and that parallel to the perovskite layer decreased. Consequently, the change of the cell volume by the interstitial oxygen formation was small, meaning macroscopic chemical expansion is small.

    元の言語English
    ホスト出版物のタイトル16th International Conference on Nanotechnology - IEEE NANO 2016
    出版者Institute of Electrical and Electronics Engineers Inc.
    ページ429-430
    ページ数2
    ISBN(電子版)9781509039142
    DOI
    出版物ステータスPublished - 2016 11 21
    イベント16th IEEE International Conference on Nanotechnology - IEEE NANO 2016 - Sendai, Japan
    継続期間: 2016 8 222016 8 25

    出版物シリーズ

    名前16th International Conference on Nanotechnology - IEEE NANO 2016

    Other

    Other16th IEEE International Conference on Nanotechnology - IEEE NANO 2016
    Japan
    Sendai
    期間16/8/2216/8/25

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Atomic and Molecular Physics, and Optics

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  • これを引用

    Nakamura, T., & Amezawa, K. (2016). Chemically-induced structural deformation of layered perovskite oxides. : 16th International Conference on Nanotechnology - IEEE NANO 2016 (pp. 429-430). [7751481] (16th International Conference on Nanotechnology - IEEE NANO 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NANO.2016.7751481