Charge fluctuation in Sm3Te4

Y. Nemoto, T. Goto, A. Ochiai, T. Suzuki

研究成果: Conference article査読

抄録

Ultrasonic measurements for a valence-fluctuation compound Sm3Te4 have been performed. Considerable dispersion around 120 K due to a thermal hopping motion of 4f-electron among Sm2+ and Sm3+ has been observed in the ultrasonic attenuation. The relaxation time of the charge fluctuation 2πτ becomes infinite at low temperatures following as τ = τ0exp(E/kB T), here 2πτ0 = 2.5×10-13 s and E = 0.136 eV. The ln T dependence of the elastic constants similar to a two-level system of amorphous glass compounds is observed at low temperatures below 15 K. These results indicate a two-level system of the 4f-electron tunneling in the random potential of Sm2+ and Sm3+ ions due to the charge glass state.

本文言語English
ページ(範囲)136-138
ページ数3
ジャーナルPhysica B: Condensed Matter
281-282
DOI
出版ステータスPublished - 2000 6 1
外部発表はい
イベントYamada Conference LI - The International Conference on Strongly Correlated Electron Systems (SCES '99) - Nagano, Jpn
継続期間: 1999 8 241999 8 28

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • 電子工学および電気工学

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