@inproceedings{2465d0b5c74043899c702e83e9499ec2,
title = "Characterization of oxide films on SiC epitaxial (000-1) faces by angle-resolved photoemission spectroscopy measurements using synchrotron radiation",
abstract = "Thermal oxide films on SiC epitaxial (000-1) C-faces have been characterized by angle-resolved photoemission spectroscopy (AR-PES). The structure of wet oxide/SiC C-face interface was compared with that of dry oxide/SiC C-face, as well as that of dry oxide/SiC Si-face, in order to clarify why a MOS device of SiC C-face achieved good electrical properties. The improvement in electrical properties was confirmed by AR-PES measurements, evidencing differences in binding energy between SiC and the Si4+ components in Si2p and valence band region, and in binding energy between SiC and the CHx components in C1s. The reason for the improvement in electrical property of MOS devices by use of SiC C-face are discussed in terms of depth profiles of oxide films calculated from the AR-PES results.",
keywords = "(000-1) face, Bonding, Dry oxidation, Oxide/SiC interface, Photoelectron spectroscopy, Wet oxidation",
author = "Y. Hijikata and H. Yaguchi and S. Yoshida and Y. Takata and K. Kobayashi and S. Shin and H. Nohira and T. Hattori",
year = "2005",
month = jan,
day = "1",
doi = "10.4028/0-87849-963-6.585",
language = "English",
isbn = "0878499636",
series = "Materials Science Forum",
publisher = "Trans Tech Publications Ltd",
pages = "585--588",
booktitle = "Silicon Carbide and Related Materials 2004, ECSCRM 2004 - Proceedings of 5th European Conference on Silicon Carbide and Related Materials",
note = "5th European Conference on Silicon Carbide and Related Materials, ECRSCRM2004 ; Conference date: 31-08-2004 Through 04-09-2004",
}