Characterization and modeling of tunnel barrier reliability

Kentaro Nakajima, Minoru Amano, Misayuki Sagoi, Yoshiaki Saito

研究成果: Conference article査読


The characterization and modeling of tunnel barrier reliability was done. The dielectric breakdown of ferromagnetic tunnel junctions (MTJ) was investigated by means of current sweep experiments and time-to-breakdown measurements. The junction area dependence of the breakdown voltage was studied.

ジャーナルDigests of the Intermag Conference
出版ステータスPublished - 2002 12 1
イベント2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
継続期間: 2002 4 282002 5 2

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

フィンガープリント 「Characterization and modeling of tunnel barrier reliability」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。