Characterization and modeling of tunnel barrier reliability

Kentaro Nakajima, Minoru Amano, Misayuki Sagoi, Yoshiaki Saito

研究成果: Conference article査読

抄録

The characterization and modeling of tunnel barrier reliability was done. The dielectric breakdown of ferromagnetic tunnel junctions (MTJ) was investigated by means of current sweep experiments and time-to-breakdown measurements. The junction area dependence of the breakdown voltage was studied.

本文言語English
ページ(範囲)BB06
ジャーナルDigests of the Intermag Conference
出版ステータスPublished - 2002 12 1
外部発表はい
イベント2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
継続期間: 2002 4 282002 5 2

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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