Characteristic length scale of bicontinuous nanoporous structure by fast Fourier transform

Takeshi Fujita, Mingwei Chen

研究成果: Article査読

68 被引用数 (Scopus)

抄録

We propose a method derived from fast Fourier transform (FFT) process to measure the characteristic length scale of bicontinuous nanoporous structures. By rotationally averaging the FFT power spectrum of a nanoporous micrograph from scanning electron microscope (SEM) or transmission electron microscope (TEM), a significant peak in the power spectrum can be obtained, which reflects the characteristic length scale of the quasi-periodic structure. This method is demonstrated for the bicontinuous morphology that is frequently observed in nanoporous metals prepared by chemical or electrochemical dealloying.

本文言語English
ページ(範囲)1161-1163
ページ数3
ジャーナルJapanese journal of applied physics
47
2 PART 1
DOI
出版ステータスPublished - 2008 2 15

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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