TY - JOUR
T1 - Characteristic length scale of bicontinuous nanoporous structure by fast Fourier transform
AU - Fujita, Takeshi
AU - Chen, Mingwei
PY - 2008/2/15
Y1 - 2008/2/15
N2 - We propose a method derived from fast Fourier transform (FFT) process to measure the characteristic length scale of bicontinuous nanoporous structures. By rotationally averaging the FFT power spectrum of a nanoporous micrograph from scanning electron microscope (SEM) or transmission electron microscope (TEM), a significant peak in the power spectrum can be obtained, which reflects the characteristic length scale of the quasi-periodic structure. This method is demonstrated for the bicontinuous morphology that is frequently observed in nanoporous metals prepared by chemical or electrochemical dealloying.
AB - We propose a method derived from fast Fourier transform (FFT) process to measure the characteristic length scale of bicontinuous nanoporous structures. By rotationally averaging the FFT power spectrum of a nanoporous micrograph from scanning electron microscope (SEM) or transmission electron microscope (TEM), a significant peak in the power spectrum can be obtained, which reflects the characteristic length scale of the quasi-periodic structure. This method is demonstrated for the bicontinuous morphology that is frequently observed in nanoporous metals prepared by chemical or electrochemical dealloying.
KW - Dealloying
KW - Image analysis
KW - Nanoporous gold
KW - Scanning electron microscopy (SEM)
KW - Transmission electron microscopy (TEM)
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U2 - 10.1143/JJAP.47.1161
DO - 10.1143/JJAP.47.1161
M3 - Article
AN - SCOPUS:40549131677
VL - 47
SP - 1161
EP - 1163
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 2 PART 1
ER -