Calibration process for the Young's modulus of a mechanically trapped microbead measured by atomic force microscopy

Di Chang, Takahiro Hirate, Chihiro Uehara, Nobuyuki Uozumi, Fumihito Arai

研究成果: Conference contribution

抄録

This paper reports the measurement of the mechanical property of a trapped microbead using atomic force microscopy (AFM). The influence of the AFM sample immobilization method, which is called mechanical trapping method, is calibrated according to simulation software and force analysis. The calibration accuracy is verified using some PDMS beads.

本文言語English
ホスト出版物のタイトルMHS 2019 - 30th 2019 International Symposium on Micro-NanoMechatronics and Human Science
出版社Institute of Electrical and Electronics Engineers Inc.
ISBN(電子版)9781728126746
DOI
出版ステータスPublished - 2019 12月 1
イベント30th International Symposium on Micro-NanoMechatronics and Human Science, MHS 2019 - Nagoya, Japan
継続期間: 2019 12月 12019 12月 4

出版物シリーズ

名前MHS 2019 - 30th 2019 International Symposium on Micro-NanoMechatronics and Human Science

Conference

Conference30th International Symposium on Micro-NanoMechatronics and Human Science, MHS 2019
国/地域Japan
CityNagoya
Period19/12/119/12/4

ASJC Scopus subject areas

  • 生体医工学
  • 電子工学および電気工学
  • 機械工学
  • モデリングとシミュレーション
  • 器械工学

フィンガープリント

「Calibration process for the Young's modulus of a mechanically trapped microbead measured by atomic force microscopy」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル