Calculation of Noise Intensity in the Frequency Demodulation for Atomic Force Microscopy

Yukio Hasegawa, Toyoaki Eguchi, Toshu An, Masanori Ono, Kotone Akiyama, Toshio Sakuf

研究成果: Article査読

8 被引用数 (Scopus)

抄録

Noise intensity in the resonance frequency shift (Δf) signal of the cantilever oscillation, which is an indirect measure of force in non-contact atomic force microscopy, was calculated and compared with those measured experimentally. It is found that the output noise amplitude is proportional to the ratio of noise to the oscillation amplitude measured at the input of the frequency demodulator. Our analysis indicates that improving the sensitivity to cantilever deflection can reduce the noise in the Δf signal.

本文言語English
ページ(範囲)L303-L305
ジャーナルJapanese Journal of Applied Physics, Part 2: Letters
43
2 B
DOI
出版ステータスPublished - 2004 2月 15

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(その他)
  • 物理学および天文学(全般)

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