Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS2

K. Terashima, J. Sonoyama, M. Sunagawa, H. Fujiwara, T. Nagayama, T. Muro, M. Nagao, S. Watauchi, I. Tanaka, H. Okazaki, Y. Takano, Y. Mizuguchi, H. Usui, K. Suzuki, K. Kuroki, T. Wakita, Y. Muraoka, T. Yokoya

    研究成果: Conference article査読

    2 被引用数 (Scopus)

    抄録

    Bulk electronic structure of novel layered superconductor Nd(O,F)BiS2 was studied by using soft x-ray angle-resolved photoelectron spectroscopy (ARPES). Electron-like Fermi surface centered at the X(R) point was observed, consistent with earlier ARPES reports on surface-sensitive VUV light source. Based on the comparison of the electronic structure between Nd(O,F)BiS2 and La(O,F)BiS2, we discuss possible important factors for the superconductivity in this series of material.

    本文言語English
    論文番号012003
    ジャーナルJournal of Physics: Conference Series
    683
    1
    DOI
    出版ステータスPublished - 2016 2月 5
    イベントTMU International Symposium on New Quantum Phases Emerging from Novel Crystal Structure - Tokyo, Japan
    継続期間: 2015 9月 242015 9月 25

    ASJC Scopus subject areas

    • 物理学および天文学(全般)

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