Benchmarking of a surface potential based organic thin-film transistor model against C10-DNTT high performance test devices

T. K. Maiti, T. Hayashi, H. Mori, M. J. Kang, K. Takimiya, M. Miura-Mattausch, H. J. Mattausch

研究成果: Conference contribution

6 被引用数 (Scopus)

抄録

In this paper, a surface potential based compact model for organic thin-film transistors (OTFTs) including both tail and deep trap states across the band gap is presented and benchmarked against measured data from high-performance dinaphtho thieno thiophene (C10-DNTT) based test devices. This model can accurately describe the OTFT test-structure current from week to strong inversion regime.

本文言語English
ホスト出版物のタイトル2013 IEEE International Conference on Microelectronic Test Structures, ICMTS 2013 - Conference Proceedings
ページ157-161
ページ数5
DOI
出版ステータスPublished - 2013
イベント2013 International Conference on Microelectronic Test Structures, ICMTS 2013 - Osaka, Japan
継続期間: 2013 3 252013 3 28

出版物シリーズ

名前IEEE International Conference on Microelectronic Test Structures

Conference

Conference2013 International Conference on Microelectronic Test Structures, ICMTS 2013
CountryJapan
CityOsaka
Period13/3/2513/3/28

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

フィンガープリント 「Benchmarking of a surface potential based organic thin-film transistor model against C<sub>10</sub>-DNTT high performance test devices」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル