Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator

Toshu An, Takahiro Nishio, Toyoaki Eguchi, Masanori Ono, Atsushi Nomura, Kotone Akiyama, Yukio Hasegawa

研究成果: Article査読

32 被引用数 (Scopus)

抄録

Low-temperature ultrahigh vacuum frequency-modulation atomic force microscopy (AFM) was performed using a 1 MHz length-extension type of quartz resonator as a force sensor. Taking advantage of the high stiffness of the resonator, the AFM was operated with an oscillation amplitude smaller than 100 pm, which is favorable for high spatial resolution, without snapping an AFM tip onto a sample surface. Atomically resolved imaging of the adatom structure on the Si (111) - (7×7) surface was successfully obtained.

本文言語English
論文番号033703
ジャーナルReview of Scientific Instruments
79
3
DOI
出版ステータスPublished - 2008
外部発表はい

ASJC Scopus subject areas

  • Instrumentation

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