Atomic structure and strain field of threading dislocations in CeO 2 thin films on yttria-stabilized ZrO2

Hajime Hojo, Eita Tochigi, Teruyasu Mizoguchi, Hiromichi Ohta, Naoya Shibata, Bin Feng, Yuichi Ikuhara

    研究成果: Article査読

    21 被引用数 (Scopus)

    抄録

    Threading dislocations in CeO2 thin films grown on yttria-stabilized ZrO2 substrates were investigated by transmission electron microscopy (TEM), high-resolution TEM, and scanning TEM. It is revealed that there are two kinds of threading dislocations with the Burgers vector of b=1/2 〈 110 〉: one is pure edge-type and the other is mixed-type. Comparing the strain field of the mixed-type dislocations with that of the Peierls-Nabarro and the Foreman dislocation models, we find that the Foreman model better describes it in CeO2.

    本文言語English
    論文番号153104
    ジャーナルApplied Physics Letters
    98
    15
    DOI
    出版ステータスPublished - 2011 4 11

    ASJC Scopus subject areas

    • Physics and Astronomy (miscellaneous)

    フィンガープリント 「Atomic structure and strain field of threading dislocations in CeO <sub>2</sub> thin films on yttria-stabilized ZrO<sub>2</sub>」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

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