Atomic imaging in EBCO superconductor films by an X-ray holography system using a toroidally bent graphite analyzer

Tsuguhisa Sekioka, Kouichi Hayashi, Eiichiro Matsubara, Yukio Takahashi, Tetsutaro Hayashi, Mititaka Terasawa, Tohru Mitamura, Akihiro Iwase, Osamu Michikami

研究成果: Article査読

8 被引用数 (Scopus)

抄録

X-ray fluorescence holography (XFH) is a new technique enabling the determination of the three-dimensional local atomic structure around a certain element. This method has been applied to analyze the local structure around Cu in 300 nm thin films of EuBa2Cu3O7-δ (EBCO) epitaxially grown on MgO (100) substrate, using the newest system for XFH measurement and high-brilliance synchrotron radiation at SPring-8. Here, the results of a study on the irradiation effect on the local atomic structure of EBCO superconductor with XFH measurements are presented.

本文言語English
ページ(範囲)530-533
ページ数4
ジャーナルJournal of Synchrotron Radiation
12
4
DOI
出版ステータスPublished - 2005 7 1

ASJC Scopus subject areas

  • 放射線
  • 核物理学および高エネルギー物理学
  • 器械工学

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