Atomic flux divergence in bamboo line for predicting initial formation of voids and hillocks

K. Sasagawa, M. Hasegawa, M. Saka, H. Abé

研究成果: Article査読

13 被引用数 (Scopus)

抄録

A calculation method of the atomic flux divergence due to electromigration, AFDgen, has been proposed considering two-dimensional distributions of current density and temperature and also simply considering the line structure of not only polycrystalline line but also bamboo line. The validity of AFDgen for bamboo lines has been verified in comparison of void formation calculated by using AFDgen with experimental results, and it has been shown that void formation in bamboo line is able to be predicted by using AFDgen. In this study, angled bamboo lines are treated for prediction of hillock formation, and hillock formation predicted by using AFDgen is compared with that measured in experiment. In addition to the verification of void prediction, the usefulness of the prediction method for electromigration damage using AFDgen is discussed in more detail.

本文言語English
ページ(範囲)67-72
ページ数6
ジャーナルTheoretical and Applied Fracture Mechanics
33
1
DOI
出版ステータスPublished - 2000

ASJC Scopus subject areas

  • 材料科学(全般)
  • 凝縮系物理学
  • 機械工学
  • 応用数学

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