Atomic and electronic structures of Cu/sapphire interfaces by HRTEM and EELS analyses

T. Sasaki, T. Mizoguchi, K. Matsunaga, S. Tanaka, T. Yamamoto, M. Kohyama, Y. Ikuhara

研究成果: Conference article査読

3 被引用数 (Scopus)

抄録

Interfacial atomic and electronic structures of Cu/Al2O 3(0001) and Cu/Al2O3(1120) prepared by a pulsed-laser deposition technique were characterized by high-resolution transmission electron microscopy (HRTEM) and electron energy-loss spectroscopy (EELS). It was found that both systems have O-terminated interfaces, irrespective of different substrate orientations. This indicates that Cu-O interactions across the interface play an important role for the Cu/Al 2O3 systems.

本文言語English
ページ(範囲)3859-3862
ページ数4
ジャーナルMaterials Science Forum
475-479
V
DOI
出版ステータスPublished - 2005
外部発表はい
イベントPRICM 5: The Fifth Pacific Rim International Conference on Advanced Materials and Processing - Beijing, China
継続期間: 2004 11月 22004 11月 5

ASJC Scopus subject areas

  • 材料科学(全般)
  • 凝縮系物理学
  • 材料力学
  • 機械工学

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