Interfacial atomic and electronic structures of Cu/Al2O 3(0001) and Cu/Al2O3(1120) prepared by a pulsed-laser deposition technique were characterized by high-resolution transmission electron microscopy (HRTEM) and electron energy-loss spectroscopy (EELS). It was found that both systems have O-terminated interfaces, irrespective of different substrate orientations. This indicates that Cu-O interactions across the interface play an important role for the Cu/Al 2O3 systems.
|ジャーナル||Materials Science Forum|
|出版ステータス||Published - 2005|
|イベント||PRICM 5: The Fifth Pacific Rim International Conference on Advanced Materials and Processing - Beijing, China|
継続期間: 2004 11月 2 → 2004 11月 5
ASJC Scopus subject areas