Atom-resolved STEM characterization for advanced materials

Yuichi Ikuhara

研究成果: Article査読

抄録

Recently developed Cs corrected HAADF and ABF STEM are applied to visualize a single atom in a crystal and to directly observe the light elements in a crystal. These results are quantitatively analyzed and interpreted by combining first principles calculations. It is demonstrated that HAADF-STEM enables us to directly observe single dopant in a crystal and the dopant distribution in Ce doped cubic boron nitride (CBN). It is also shown that ABF-STEM is very powerful to directly observe the light elements such as lithium and hydrogen atomic columns in the respective crystals.

本文言語English
ページ(範囲)628-629
ページ数2
ジャーナルKobunshi
63
9
出版ステータスPublished - 2014 9月 1
外部発表はい

ASJC Scopus subject areas

  • 化学工学(全般)

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