Applications of X-ray fluorescence holography to determine local lattice distortions

Kouichi Hayashi, Naohisa Happo, Shinya Hosokawa

研究成果: Article査読

10 被引用数 (Scopus)

抄録

X-ray fluorescence holography (XFH) is a method for investigating atomic order up to the medium ranges, and can provide 3D atomic images around specific elements within a radius of nm order. In addition to these characteristics, XFH is sensitive to positional fluctuations of atoms, and therefore it is useful for characterizing the local lattice distortions around specific elements. We have applied XFH to dopants and mixed crystals. We found interesting features in local lattice distortions, such as the displacements of first-neighbor atoms around dopants, far-sighted views of the atomistic fluctuations in mixed crystals, and the coexistence of distorted/undistorted sites in the same material.

本文言語English
ページ(範囲)337-346
ページ数10
ジャーナルJournal of Electron Spectroscopy and Related Phenomena
195
DOI
出版ステータスPublished - 2014

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 物理化学および理論化学
  • 分光学
  • 凝縮系物理学
  • 原子分子物理学および光学
  • 放射線

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