Application of positron beams to the study of positronium-forming solids

Y. Kobayashi, K. Ito, T. Oka, C. He, H. F.M. Mohamed, R. Suzuki, T. Ohdaira

研究成果: Article査読

16 被引用数 (Scopus)

抄録

Doppler broadening of annihilation radiation (DBAR) and positron annihilation lifetime spectroscopy (PALS) have been successfully applied to the study of positronium (Ps)-forming amorphous solids such as polymers and silicon oxide in the bulk. Implementing depth selectivity to DBAR and PALS by combining them with variable-energy positron beams considerably broadens their applicability. Variation of incident positron energy over a wide range enables depth-profiling, whereas tuning of the beam energy enables the studies of surfaces, interfaces and thin films. In this paper, we discuss fundamentals and applications of energy variable DBAR and PALS for Ps-forming polymers and silicon oxide.

本文言語English
ページ(範囲)174-178
ページ数5
ジャーナルApplied Surface Science
255
1
DOI
出版ステータスPublished - 2008 10 31
外部発表はい

ASJC Scopus subject areas

  • 化学 (全般)
  • 凝縮系物理学
  • 物理学および天文学(全般)
  • 表面および界面
  • 表面、皮膜および薄膜

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