Application of OMEMS technology in trapped ion quantum computing

Stephen Crain, Emily Mount, So Young Baek, Jungsang Kim, Peter Maunz

研究成果: Conference contribution

抄録

Scalability is one of the main challenges of trapped ion based quantum computation, partly limited by the ability to manipulate the increasing number of quantum bits (qubits). For individual addressing of qubits, microelectromechanical systems (MEMS) technology allows one to design movable micromirrors to focus laser beams on individual ions and steer the focal point in two dimensions. This system is able to scale to multiple beams, has switching speeds comparable to typical single qubit gate times, and has negligible crosstalk on neighboring ions.

本文言語English
ホスト出版物のタイトルOMN 2015 Jerusalem - 2015 International Conference on Optical MEMS and Nanophotonics, Proceedings
出版社IEEE Computer Society
ISBN(電子版)9781467368346
DOI
出版ステータスPublished - 2015 10月 2
外部発表はい
イベントInternational Conference on Optical MEMS and Nanophotonics, OMN 2015 - Jerusalem, Israel
継続期間: 2015 8月 22015 8月 5

出版物シリーズ

名前International Conference on Optical MEMS and Nanophotonics
02-05-August-2015
ISSN(印刷版)2160-5033
ISSN(電子版)2160-5041

Other

OtherInternational Conference on Optical MEMS and Nanophotonics, OMN 2015
国/地域Israel
CityJerusalem
Period15/8/215/8/5

ASJC Scopus subject areas

  • ハードウェアとアーキテクチャ
  • 電子工学および電気工学
  • 電子材料、光学材料、および磁性材料

フィンガープリント

「Application of OMEMS technology in trapped ion quantum computing」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル