Anion arrangement analysis of oxynitride perovskite thin film with inverse photoelectron holography

Y. Yamamoto, A. K.R. Ang, K. Kimura, T. Matsushita, Y. Hirose, D. Oka, Koichi Hayashi

研究成果: Article査読

1 被引用数 (Scopus)

抄録

Oxynitride perovskites are an emerging class of materials that have intriguing electrical and optical properties that can be used for a wide variety of novel applications. The arrangement of the anions significantly drives these properties, but it is difficult to assess the anion arrangements in thin film samples. Inverse photoelectron holography is an atomic resolution holography technique that can directly measure the local structure around atoms of light elements in a sample. The holograms of the anions in SrTaO2N thin films were obtained and a remarkable difference was found between the O and N holograms. Analysis of the holographic features and simulations suggests that the sample consists of trans-type anion ordering. A new structural model consisting of trans-type structures where the N anions are aligned in different directions was proposed, and the resulting simulated hologram agrees well with the experiment.

本文言語English
論文番号147018
ジャーナルJournal of Electron Spectroscopy and Related Phenomena
246
DOI
出版ステータスPublished - 2021 1月

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 放射線
  • 原子分子物理学および光学
  • 凝縮系物理学
  • 分光学
  • 物理化学および理論化学

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