We have investigated the angular dependence of exchange bias (Hex) and coercivity (Hc) in polycrystalline CoFe (100 nm)/MnIr(x) bilayers with x=0, 2, 4, 10 and 20 nm. The angular dependence of Hex and Hc show the abrupt kinks at critical angle (θc) in the samples of Hc>Hex. The profiles of angular dependent Hex is changed at critical antiferromagnetic layer thickness ( tAFc ) and shows inverse proportional behavior with field angle from 90°-θc to 90°+θc. These complex angular dependence of Hex and Hc with antiferromagnetic layer thickness can be well explained by using the Stoner-Wohlfarth (S-W) model.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics