Angle-resolved photoemission study o

T. Yokoya, A. Chainani, T. Takahashi, H. Ding, J. Campuzano, H. Katayama-Yoshida, M. Kasai, Y. Tokura

研究成果: Article

58 引用 (Scopus)


We present high-resolution (HR) angle-resolved photoemission spectroscopy (ARPES) measurements of the noncuprate layered perovskite superconductor (Formula presented)(Formula presented). ARPES spectra of the whole valence-band region obtained along two high-symmetry directions in the Brillouin zone show clear dispersion, generally similar to that of a band calculation. However, HRARPES measurements taken in the vicinity of the Fermi level ((Formula presented)) show narrower Ru4dɛ(xy, yz, zx)-O2pπ antibonding bands than those predicted by the band calculation. More significantly, there is an extended van Hove singularity very close to (Formula presented) ((Formula presented)=11 meV) along the Ru-O bonding direction, which is known to exist in cuprate high-temperature superconductors. The Fermi-surface topology obtained by HRARPES (one electronlike Fermi surface sheet centered at the Γ point and two holelike sheets centered at the X point) is different from the band calculation (two electronlike sheets centered at the Γ point and one holelike sheet centered at the X point), although the electron count is the same in both cases. These results suggest that electron-electron correlations cause the modification of the Fermi-surface topology, and is thus necessary for understanding the electronic structure and properties of (Formula presented)(Formula presented).

ジャーナルPhysical Review B - Condensed Matter and Materials Physics
出版物ステータスPublished - 1996 1 1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

フィンガープリント Angle-resolved photoemission study o' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用

    Yokoya, T., Chainani, A., Takahashi, T., Ding, H., Campuzano, J., Katayama-Yoshida, H., Kasai, M., & Tokura, Y. (1996). Angle-resolved photoemission study o. Physical Review B - Condensed Matter and Materials Physics, 54(18), 13311-13318.