AFM has an advantage of obtaining topographic and mechanical properties at the same time. In analyzing the force curve using Hertz theories, elastic modulus was obtained with nanometer-scale resolution. Furthermore, sample deformation by the force exerted was also estimated from the force curve analyses. We can reconstruct a real topographic image by incorporating apparent height with deformation image. We apply this method for obtaining information about mechanical properties of a polymer ABC. We show the detail of this procedure and new information about polymer ABC.
|出版ステータス||Published - 2005 12 1|
|イベント||54th SPSJ Symposium on Macromolecules - Yamagata, Japan|
継続期間: 2005 9 20 → 2005 9 22
|Other||54th SPSJ Symposium on Macromolecules|
|Period||05/9/20 → 05/9/22|
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