Analysis of lattice defects in an epitaxial PbTiO3 thick film by transmission electron microscopy

Kenta Aoyagi, Takanori Kiguchi, Yoshitaka Ehara, Hiroshi Funakubo, Toyohiko J. Konno

研究成果: Conference contribution

抄録

The microstructure of an epitaxial PbTiO3 thick film was investigated by using transmission electron microscopy (TEM). An analysis of bright-field TEM (BFTEM) images revealed the existence of displacements along the [001] direction of PbTiO3. High-resolution TEM (HRTEM) observation indicated that stacking faults parallel to the (001) plane of PbTiO3 are formed in the thick film. Local strain fields around the stacking faults were quantified by geometric phase analysis of the HRTEM image. The measured strain suggested the presence of a pair of extrinsic and intrinsic stacking faults. The distance between an extrinsic stacking fault and an intrinsic one corresponds to two unit cells along the [001] direction of PbTiO3. The formation of these stacking faults is considered to be associated with the strain relaxation of the film.

本文言語English
ホスト出版物のタイトルElectroceramics in Japan XV
出版社Trans Tech Publications Ltd
ページ171-174
ページ数4
ISBN(印刷版)9783037857618
DOI
出版ステータスPublished - 2013
イベント31st Electronics Division Meeting of the Ceramic Society of Japan - Tokyo, Japan
継続期間: 2011 10 282011 10 29

出版物シリーズ

名前Key Engineering Materials
566
ISSN(印刷版)1013-9826
ISSN(電子版)1662-9795

Other

Other31st Electronics Division Meeting of the Ceramic Society of Japan
国/地域Japan
CityTokyo
Period11/10/2811/10/29

ASJC Scopus subject areas

  • 材料科学(全般)
  • 材料力学
  • 機械工学

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