An X-Ray Diffraction Study of Martensitic Transformation in Ti-Doped Nb3Sn

Yousuke Watanabe, Naoki Toyota, Tetsuo Inoue, Hiroshi Komatsu, Hiroshi Iwasaki

研究成果: Article査読

10 被引用数 (Scopus)

抄録

The effect of titanium addition on the martensitic transformation in Nb3Sn was investigated by low-temperature X-ray diffraction using small-sized (0.1–0.3 mm) high-quality single crystals. It has been found that addition of 0.2 at.% Ti lowers the transformation temperature, Tmby 3 K while further addition up to 1.5 at.% suppresses the transformation. Tmis very sensitive to the manner of sample adhesion to the cold end of the cryostat and it rises nearly to ambient temperature if improperly adhered. The axial ratio a/c of the 0.2 at.% Ti doped alloy was measured to be 1.001 at 30 K, which compares to a value of 1.005 for the undoped alloy. A tendency to form a single tetragonal domain with decreasing temperature through Tmfor the 0.2 at.% Ti doped alloy was observed.

本文言語English
ページ(範囲)2218-2223
ページ数6
ジャーナルJapanese journal of applied physics
27
12R
DOI
出版ステータスPublished - 1988 12
外部発表はい

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

フィンガープリント

「An X-Ray Diffraction Study of Martensitic Transformation in Ti-Doped Nb<sub>3</sub>Sn」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル