An in-process measurement probe for profile generation with using no datum

Ichiro Ogura, Wei Gao, Hideki Koiwa, Satoshi Kiyono

研究成果: Article査読

抄録

This paper presents newly developed force controllable measurement probes which will be used for profile generation with using no external reference. These probes are able to perform measurement and fabrication simultaneously. Measurement ability of probe type 1, which has cantilever and lapping pad, is tested experimentally. The results of this experiment indicate that the repeatability error increases with measurement force, because the lapping pad inclines when it is pressed to the test surface. Probe type 2 is developed to solve this problem. Both lever ends of this probe are held by piezoelectric actuators, and the pad is attached to the center of the lever. Control system of this probe is decided form consideration of lever inclining. It is appeared that the probe type 2 has better measurement ability than probe type 1 from experimental result. In-process measurement by using probe type 2 is tested. A silicon wafer is machined by this probe under the non-linear control mode. Relation of machined amount between lapping force and machined amount between time are investigated basically.

本文言語English
ページ(範囲)1285-1289
ページ数5
ジャーナルSeimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering
63
9
DOI
出版ステータスPublished - 1997
外部発表はい

ASJC Scopus subject areas

  • 機械工学

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