An electron-beam profile monitor using fresnel zone plates

Norio Nakamura, Hiroshi Sakai, Kensuke Iida, Kenji Shinoe, Hiroyuki Takaki, Masami Fujisawa, Hitoshi Hayano, Toshiya Muto, Masaharu Nomura, Yukihide Kamiya, Tadashi Koseki, Yoshiyuki Amemiya, Nobutada Aoki, Koichi Nakayama

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

We have developed a beam profile monitor using two Fresnel zone plates (FZPs) at the KEK-ATF (Accelerator Test Facility) damping ring to measure small electron-beam sizes for low-emittance synchrotron radiation sources. The monitor has a structure of an X-ray microscope, where two FZPs constitute an X-ray imaging optics. In the monitor system, the synchrotron radiation from the electron beam at the bending magnet is monochromatized to 3.235-keV X-rays by a crystal monochromator and the transverse electron-beam image is twenty-times magnified by the two FZPs and detected on an X-ray CCD camera. This monitor has the following advantages: (1) high spatial resolution, (2) non-destructive measurement, (3) real-time monitoring and (4) direct electron-beam imaging. With the beam profile monitor, we have succeeded in obtaining a clear electron-beam image and measuring the extremely small beam size less than 10 μm. The measured magnification of the imaging optics was in good agreement with the design value.

本文言語English
ホスト出版物のタイトルSynchrotron Radiation Instrumentation
ホスト出版物のサブタイトル8th International Conference on Synchrotron Radiation Instrumentation
出版社American Institute of Physics Inc.
ページ545-548
ページ数4
ISBN(電子版)0735401799
DOI
出版ステータスPublished - 2004 5 12
外部発表はい
イベント8th International Conference on Synchrotron Radiation Instrumentation - San Francisco, United States
継続期間: 2003 8 252003 8 29

出版物シリーズ

名前AIP Conference Proceedings
705
ISSN(印刷版)0094-243X
ISSN(電子版)1551-7616

Other

Other8th International Conference on Synchrotron Radiation Instrumentation
CountryUnited States
CitySan Francisco
Period03/8/2503/8/29

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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