An apparatus for measuring the beam emittance of the Tohoku AVF cyclotron

K. Ishii, M. Fujioka, H. Orihara, T. Shinozuka, K. Sera, S. Morita, M. Maruyama, Y. Tsuji

研究成果: Article査読

2 被引用数 (Scopus)

抄録

An emittance-measuring system for beams from an AVF (azimuthally varying field) cyclotron was designed, constructed and tested, and has been proved to be very useful for operation and adjustment of the cyclotron. This system, based on the one-slit-multidetector method and controlled by microcomputers, can give an elliptical phase-space contour of a beam within one minute. An example of characteristics of an extracted beam is shown for a set of parameters of the cyclotron for 20 MeV protons.

本文言語English
ページ(範囲)1-6
ページ数6
ジャーナルNuclear Instruments and Methods
185
1-3
DOI
出版ステータスPublished - 1981 6 15

ASJC Scopus subject areas

  • 医学(全般)

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