An active magnetic probe array for the multiple-point concurrent measurement of electromagnetic emissions

Satoshi Aoyama, Shoji Kawahito, Masahiro Yamaguchi

研究成果: Article査読

6 被引用数 (Scopus)

抄録

In order to diagnose the EMI (Electromagnetic Interference) problem of ICs, an integrated active magnetic probe array has been developed in SOI (Silicon On Insulator)-CMOS technology. Three aligned differential coils, differential amplifiers, a differential to single-ended converter, an output buffer and bias circuits are all integrated in a single-chip. A measurement result shows that the probe achieves an e-field suppression ratio of 33.6 dB at 50 MHz. Furthermore, a two-dimensional magnetic field distribution map is drawn by the probe array using the 3-point concurrent measurement. The obtained image gains three times higher resolution than that of a single scan under an identical condition.

本文言語English
ページ(範囲)3303-3305
ページ数3
ジャーナルIEEE Transactions on Magnetics
42
10
DOI
出版ステータスPublished - 2006 10

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学

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