AHE measurements of very thin films and nanosized dots

N. Kikuchi, R. Murillo, J. C. Lodder

研究成果: Article査読

8 被引用数 (Scopus)

抄録

In this paper we present anomalous Hall effect analysis from very thin Co (0.5 nm) film, Co/Pt multilayers and large areas of nanosized dots as well as from a few magnetic dots having a diameter of 120 nm. The dot array is prepared from Co/Pt multilayer by using laser interference lithography (LIL) while the Hall crosses for measuring a few dots are prepared in combination with focussed ion beam (FIB). The hysteresis loops from a few dots are showing significant Hall voltage jumps corresponding to magnetic response due to an inhomogeneous reversal mechanism because the intensity of the jumps is smaller than the expected value from a total magnetization reversal of one dot.

本文言語English
ページ(範囲)320-324
ページ数5
ジャーナルJournal of Magnetism and Magnetic Materials
287
SPEC. ISS.
DOI
出版ステータスPublished - 2005 2 1
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学

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