Advanced electron microscopy for materials science

Zentaro Akase; Mitsuaki Higo; Keiko Shimada; Takafumi Sato; Hideyuki Magara; Daisuke Shindo; Nobuhiko Ohno

doi:10.2320/matertrans.MT-M2021086

Advanced electron microscopy for materials science

Zentaro Akase, Mitsuaki Higo, Keiko Shimada, Takafumi Sato, Hideyuki Magara, Daisuke Shindo, Nobuhiko Ohno

研究成果: Article › 査読

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This paper presents current research trends in advanced electron microscopy techniques for materials science. The survey is based on the special issue of Materials Transactions published in October 2019 (Vol. 60, No. 10). Advanced electron microscopy has been applied extensively to characterize various materials. The recent development and extension of analyses of electric fields and the collective motions of secondary electrons by in situ electron holography are discussed in detail.

本文言語	English
ページ（範囲）	1589-1595
ページ数	7
ジャーナル	Materials Transactions
巻	62
号	10
DOI	https://doi.org/10.2320/matertrans.MT-M2021086
出版ステータス	Published - 2021 10 1

ASJC Scopus subject areas

材料科学（全般）
凝縮系物理学
材料力学
機械工学

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10.2320/matertrans.MT-M2021086

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AU - Akase, Zentaro

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AU - Shimada, Keiko

AU - Sato, Takafumi

AU - Magara, Hideyuki

AU - Shindo, Daisuke

AU - Ohno, Nobuhiko

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Advanced electron microscopy for materials science

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