Advanced analysis of faults injected through conducted intentional electromagnetic interferences

Laurent Sauvage, Jean Luc Danger, Sylvain Guilley, Naofumi Homma, Yu-Ichi Hayashi

研究成果: Article査読

2 被引用数 (Scopus)

抄録

Experimental setups used in electromagnetic compatibility (EMC) tests can be used as platforms for fault injections. Injecting faults into equipment is a means for a malevolent attacker to extract secret information. In this paper, we first present an advanced setup, i.e., a setup with characteristics beyond the main international EMC standards. It performs more accurate measurements of the disturbance power, reducing the measurement error by 20.33 dB. Second, we propose an advanced analysis methodology allowing an attacker or a countermeasure designer to identify the disturbance frequency leading to the most powerful attack. As an illustration, the method is applied on an ASIC implementation of DES, providing a thorough characterization and classification of the generated faults. In this case, the most powerful attacks are performed when the disturbance has a frequency below 1 MHz. The threat has thus to be considered really serious, as generating such disturbance does not require a high budget.

本文言語English
論文番号6517267
ページ(範囲)589-596
ページ数8
ジャーナルIEEE Transactions on Electromagnetic Compatibility
55
3
DOI
出版ステータスPublished - 2013 5 22

ASJC Scopus subject areas

  • 原子分子物理学および光学
  • 凝縮系物理学
  • 電子工学および電気工学

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